5 Day Cumulative Patch Study (Self-Perceived Sensitive Subjects)

5 Day Cumulative Patch Study (Self-Perceived Sensitive Subjects)

  • Patch Studies
  • Sensitive Skin
  • Fairfield
  • Cumulative Irritation Test
DATES 6/09/20256/13/2025
Gender/Age Males & Females , 18-79 years old
Payment $60 upon successful completion
Number of Visits 5 Visit(s)
Screening A professional will talk to you about the requirements of the study.
Follow-up Assessments If any, follow-up assessments will be outlined during first visit.
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What to Expect

If you are eligible for the study and you choose to participate, you will:

  • Attend study visits throughout your time in the study.
  • Visits 1-5:
    Mon. Jun 9, 2025  —  Fri. Jun 13, 2025
The Cumulative Irritation Test

The Cumulative Irritation Test (CIT) is a longer trial to measure irritation response to a test product – and changes in that response – over time. Patches of the product are applied to the skin and then are replaced daily (except weekend days) through the course of the trial, usually five, 14, or 21 days. Evaluators observe, grade, and record any signs of irritation daily during the trial period. A final reading is taken the last day of patch removal. The goal of the CIT is to quantitate the irritation potential of the product.

This study is taking place in our Fairfield Facility.

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Locations

Fairfield 

70 New Dutch Lane, Fairfield, NJ
973-359-5879

Monday - Thursday: 7:30AM - 7:30PM
Friday: 7:30AM - 7:00PM

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Boonton

304 Wootton Street, Boonton, NJ
973-587-7999

Monday - Friday: 7:30AM to 4:00PM
(RIPT Only)

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CPT℠ LABS

Corporate Headquarters and Labs
70 New Dutch Ln
Fairfield, NJ 07004
973-576-5957

Satellite Clinical Lab Location
304 Wootton St.
Boonton, NJ 07005

Registrations

FDA
Registration FEI # 1000151293 as a GMP/GLP/GCP Drug Establishment and Cosmetic Facility.

DEA
Registration# RC0199744 (Analytical Lab)
Schedule I-V license
Remember, Schedules I-II require DEA Form 222
Registration# RC0171568 (Researcher)

US EPA/NJ DEP
Registration# NJD982726648

ISO/IEC 17025:2017 Accreditation # 80071